Part of the Oxford Instruments Group

Advances in Atomic Force Microscopy Techniques for Next Generation Materials Research  

Boston College Tech Talk
November 20, 2019
12:00pm - 2:00pm 

Discover where Modern Atomic Force Microscopy (AFM) can take your Research

Atomic Force Microscopy has long been used to explore the world at the nanometer scale. Yet due to the limitations of early AFMs, the technique was not fully applicable or adopted widely for use in practical work in the field which required atypical measuring conditions. For example, early AFMs were not easily able to work in or around fluid, required significant sample constraints, were painfully slow to use and generally worked in ambient conditions only.

Even in areas where AFM offered a distinct advantage for measuring biomaterials, like using force curves to measure mechanical properties of soft materials, the lack of easy calibration of all instrument parameters left users with semi-quantitative and difficult to interpret data in all but the best of cases. With recent developments and improvements to design, hardware, software, and new modes, AFM has overcome these historic challenges and is now a transformational technique available to characterize previously difficult materials and work under a wider range of measurement conditions.

Who Should Attend?

Anyone who is working in polymers, biomaterials, semiconductor, 2D materials, cell mechanobiology or those who want to learn about new techniques in the nano-space. 


Merkert 124
Boston College
2609 Beacon Street
Chesnut Hill, MA 02467
Lunch will be served

Campus Map


Drew Griffin, Asylum Research