Part of the Oxford Instruments Group

AFM Lunch & Learn
University of Arizona
October 24, 2019

Increased Resolution, Speed and Productivity with the New Asylum Research Jupiter XR Large-Sample AFM

Atomic Force Microscopes (AFMs) uncover surface properties ranging from shape and texture to local stiffness and conductivity in various research fields including semiconductors, data storage, 2D materials, polymers - to name a few.

Oxford Instruments Asylum Research will present an overview of a completely new high-performance large-sample AFM that offers superior resolution, higher speed, ease-of-use and flexibility—the Jupiter XR AFM.

Jupiter XR is the first AFM to offer ultra-low noise floor that enables atomic lattice resolution imaging, extended Z range to accommodate various size samples, and high-speed imaging to increase productivity. All these advantages are delivered in a single XY scanner and a fully accessible 200 mm sample stage. Jupiter XR offers ease-of-use features that include motorized laser alignment, automated measurements and high-quality optics for quick feature of interest location. Jupiter XR arrives equipped with blueDriveTM for quantitative, repeatable measurements and extended tip lifetime. We will demonstrate top performance and versatility of Jupiter XR by sharing results of hard drive roughness measurements, molecular-level polymer alignment, conductive molecule assembly and imaging in liquid.

This is an excellent opportunity for students, researchers and team leaders to learn about how AFM could impact their projects or just to get a glimpse of the advances in AFM technology.


Chris Orsulak, Asylum Research


Registration is free, but all attendees must register due to limited seating. 


October 24, 2019
11:30am - 1:30pm
Lunch will be served
University of Arizona
Chemical Sciences Building (CSB) Room 402

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