Part of the Oxford Instruments Group

Contact resonance modulus map of patterned titanium on silicon

ontact resonance modulus data overlaid on topography for a titanium (E?~110 GPa) thin film on silicon (E?~160 GPa) imaged using contact resonance mode. Imaged on a MFP-3D Infinity, 10 µm scan. Sample courtesy of Donna Hurley, National Institute of Standards and Technology (NIST)

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image