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Sol-gel PZT with PFM Lithography

R&D 100 logo written on a sol-gel PZT thin film by PFM lithography. PFM phase is overlaid on top of the rendered topography, 25 ┬Ám scan. Oak Ridge and Asylum Research were awarded an R&D100 award for Band Excitation in 2008. Imaged with the MFP-3D AFM.

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

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