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Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

NanoTDDB enables characterization of dielectric breakdown with nanoscale precision on Jupiter XR AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.​

  • The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations
  • Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed

*nanoTDDB is an optional accessory upgrade for Jupiter XR AFM

See nanoTDDB in action during our December 7 webinar, "Semiconductor Dielectric Material Preparation and Characterization."

SALE: From now until Dec 31, all AFM probes for TDDB are 15% off! Enter promo code nanoTDDB on checkout.


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