Layout Elements - Oxford Instruments
SustainabilityInvestorsCareers News Contact
Investors Careers
Home
Applications
Advanced ManufacturingAgriculture & FoodAstronomyAutomotive & AerospaceBio Imaging & Life Science
Chemical & CatalysisEnergy Generation & StorageForensics & EnvironmentGeology, Petrology & MiningMetals, Alloys, Composites & Ceramics
PharmaPhotonicsPolymersQuantum TechnologiesSemiconductors, Microelectronics & Data Storage
Products
ATOMIC FORCE MICROSCOPYELECTRON MICROSCOPYBEX EBSDEDSLight MicroscopyWidefield MicroscopesConfocal MicroscopesSuper Resolution Microscopes3D/4D Visualization SoftwareNanoindentation
Modular Optical SpectroscopyNuclear Magnetic ResonanceBenchtop NMR SpectroscopyTime Domain NMRConfocal Raman Microscopeswitec360 – Raman Imaging MicroscopeRISE – Raman-SEM MicroscopesRaman-based Particle AnalysisScientific Imaging Cameras
DEPOSITION TOOLSPlasma Enhanced Chemical Vapour Deposition (PECVD)Inductively Coupled Plasma Chemical Vapour Deposition (ICPCVD)Atomic Layer Deposition (ALD)Ion Beam Deposition (IBD)ETCH TOOLSInductively Coupled Plasma Etching (ICP RIE)Reactive Ion Etching (RIE)Deep Silicon Etching (DSiE)Atomic Layer Etching (ALE)Ion Beam Etching (IBE)
Dilution Fridges & Low Temperature SolutionsX-RayX-Ray SourcesX-Ray Cameras
Learning
Learning CentreWebinarsEvents
Services
Contracts & AgreementsSparesUpgrades
TrainingApplication & Product SupportLiveAssist
Shop
UKEuropeUS & CanadaAsiaJapanChina
Contact
eCommerce

Asylum Gallery Image

Dual AC Resonance Tracking (DART) of C-domains in PZT Thin Film

Author: Asylum Research

Published: 16 Nov 2017 · Last updated: 12 Jul 2018

DART image of C-domains in lead titanate thin film, 5 µm scan. Imaged with the MFP-3D AFM. Image courtesy D. Wu and A. Gruverman, UNL.

Downloads

  • DARTOI.jpg

← Back to Learning

© Oxford Instruments 2026

Website by Miramar Communications Ltd