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Ergo Software, now on the Jupiter XR Watch the 3-minute video introduction
New!
 Ergo Software, now on the Jupiter XR

Watch the 3-minute video introduction

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Scanning Capacitance Microscopy (SCM)
NEW!
 Scanning Capacitance Microscopy (SCM)

Get more information from SCM
and acquire images 20× faster!

Learn more
Measuring Surface Roughness with Jupiter XR Is Atomic Force Microscopy the Best Tool for Your Surface Roughness Measurements?
NEW White Paper!
Measuring Surface Roughness with Jupiter XR

Is Atomic Force Microscopy the Best Tool for Your Surface Roughness Measurements?

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Asylum Research is the Technology Leader in Atomic Force Microscopy

Let's get virtual!  Asylum is here with learning and support resources.

Find the Best AFM for Your Research

Atomic force microscopy: Cypher Family of AFMS

Cypher Family of AFMs

  • Ultra-high resolution
  • Unmatched speed
  • Simple environmental control
  • Fast and easy to get great results
Atomic force microscopy: Jupiter XR AFM

Jupiter XR AFM

  • Highest resolution large-sample AFM
  • 5-20× faster imaging than most AFMs
  • Simpler experience, from setup to results
  • Ideal for both research and industrial R&D
Atomic force microscopy: MFP-3D Family of AFMS

MFP-3D Family of AFMs

  • High performance
  • Widest range of modes and accessories
  • Simple to use yet flexible
  • Solutions for every budget

Latest News & Events

Sep 11, 2020
COVID-19 update

The interests and wellbeing of our employees and customers are at the centre of all we do, and this is particularly important…

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Jun 17, 2020
Jupiter XR Large-Sample AFM Now Includes…

Oxford Instruments Asylum Research Jupiter XR Large-Sample AFM Now Includes New Ergo Software Interface for Even Greater Productivity

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Jun 10, 2020
New Relate Software

Press Release: New “Relate” Software for Correlative Imaging with Atomic Force Microscopy and Electron Microscopy

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Nov
2
French SPM Days 2020
Location: Saint-Valery-sur-Somme, France
Businesses Attending:
Asylum Research
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