Cypher IDS enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating the dominant source of artifacts.
High voltage nanoTDDB allows you to measure dielectric breakdown with nanoscale precision on samples up to 200 mm in diameter.
Peter Serles uses a full suite of AFM modes to examine frictional properties in 2D materials such as magnetene, MoS2, and hBN.
Asylum Research today announced the launch of the nanoTDDB high voltage accessory. This accessory expands the range of electrical…
HVA150 – High Voltage Accessory for Jupiter XR, Large Sample Atomic Force Microscope
Oxford Instruments remains committed to supporting our customers globally in addressing some of the world’s most pressing challenges…