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NEW Jupiter Discovery AFM

Next-generation AFM Performance for Everyone

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Vero AFM Wins New Product Awards

2024 R&D 100 Award and the 2024 Market Disruptor Special Recognition Bronze Award

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The Technology Leader in Atomic Force Microscopy

At Oxford Instruments, we specialize in making the best atomic force microscopes for academic research and industrial R&D. Our passion for innovating AFM technology drives us to continuously develop higher-performance AFMs.

Featured Products 

Vero AFMs combine next-gen QPDI technology with Cypher’s proven performance to deliver unmatched accuracy, precision, and repeatability.
Vero Family of AFMs
  • True tip displacement measurement
  • Patented QPDI precision 
  • Unrivaled accuracy
Delivers ultra-high performance and exceptional usability, meeting growing demands for precision, repeatability, and efficiency.
Jupiter Discovery AFM
  • Next-generation design
  • Optimised workflow
  • Unmatched configurability
Ultra-high-performance AFM with top-tier resolution, speed, and control.
Cypher Family of AFMs
  • Ultra-high resolution
  • Unmatched speed & instant results
  • Simple environmental control

Latest News & Events

Sep 24, 2026
Oxford Instruments launches global Insight…

Oxford Instruments has today announced the launch of its Insight Awards, a global awards programme recognising outstanding achievements,…

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May 28, 2025
Introducing the Jupiter Discovery AFM

Large-Sample AFM Provides Next-Generation Performance for Everyone

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Sep 4, 2024
Oxford Instruments Asylum Research Releases…

Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables…

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Sep
27
ICSCRM 2026
Location: Yokohama, Japan
Businesses Attending:
Asylum Research, EBSD, NanoAnalysis, OI Academy, Plasma Technology, Raman
View Event >
Oct
4
ISTFA 2026
Location: San Antonio, TX | USA
Businesses Attending:
Asylum Research, NanoAnalysis, Raman, NanoIndentation
View Event >
View all events
> Looking for one of the Asylum Research landing pages?
> Atomic Force Microscopy Outreach Articles