Layout Elements - Oxford Instruments

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Ni on INVAR

Author: Asylum Research

Published: 16 Nov 2017 · Last updated: 20 Feb 2019

MFM signal overlaid onto the rendered topography of a nickel coated piece of machined INVAR, 90 µm scan. Imaged with the MFP-3D AFM.

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  • InvarOI.jpg

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