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Mechanical and Electrical Properties

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  3. Mechanical and Electrical Properties

Related to: Metals, Alloys, Composites & Ceramics

Atomic Force Microscopy (AFM) is well-suited to studying the nanoscale and microscale morphology and mechanical, electrical and functional properties of metals and ceramics. Please refer to the pages linked below for more information about how AFM is used in each of these areas.

AFM for Polymer Science

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AFM Tools for Piezoelectrics and Ferroelectrics Research

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AFM for Nanomechanical Measurements

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AFM for Nanoelectrical Characterization

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Products

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed…

Cypher ES Environmental AFM

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The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance…

MFP-3D Origin AFM

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The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the…

Cypher S AFM Microscope

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The Cypher VRS is the first and only full-featured video-rate atomic force microscope (AFM). This high speed AFM allows researchers to measure nanoscale dynamic processes at video…

Cypher VRS: High Speed Video-Rate AFM

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The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility…

Cypher ES Polymer Edition AFM

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The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides…

Jupiter XR AFM

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The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with…

MFP-3D Infinity AFM

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

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The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile…

MFP-3D Origin+ AFM

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The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises…

MFP-3D-BIO AFM

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Learning Centre Assets

Ay, There's the Rub: An AFM Investigation of Tribofilm Formation

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