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Mechanical and Electrical Properties

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Related to: Metals, Alloys, Composites & Ceramics

Atomic Force Microscopy (AFM) is well-suited to studying the nanoscale and microscale morphology and mechanical, electrical and functional properties of metals and ceramics. Please refer to the pages linked below for more information about how AFM is used in each of these areas.

AFM for Polymer Science

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AFM Tools for Piezoelectrics and Ferroelectrics Research

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AFM for Nanomechanical Measurements

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AFM for Nanoelectrical Characterization

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Products

The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility…

Cypher ES Polymer Edition AFM

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The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain…

Cypher S AFM Microscope

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The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained…

Cypher ES Environmental AFM

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The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises to AFM imaging…

MFP-3D-BIO AFM

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The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance and affordability and…

MFP-3D Origin AFM

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The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200…

Jupiter XR AFM

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The Cypher VRS1250 is twice as fast as the first-generation Cypher VRS, scanning at up to 1250 lines/second. This enables either higher temporal resolution with frame rates up to 45…

Cypher VRS1250 Video-Rate High Speed AFM

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical…

Interferometric Displacement Sensor (IDS)

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical…

Interferometric Displacement Sensor

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The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with renowned versatility,…

MFP-3D Infinity AFM

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The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile and high performance…

MFP-3D Origin+ AFM

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Learning Centre Assets

Ay, There's the Rub: An AFM Investigation of Tribofilm Formation

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