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Piezoresponse force microscopy (PFM) is an atomic force microscopy technique that can be used to characterize the electromechanical coupling underlying the functionality of many material systems, including piezoelectrics, ferroelectrics, and certain biological materials. An electrical stimulus is applied locally to the sample through the AFM tip while the mechanical response, on the order of ~1-100 pm/V, is simultaneously measured. This technique is relevant to both basic materials science research and a rich field of applied technologies. Asylum Research is recognized as the world leader in commercial PFM technology by providing crosstalk-free, high sensitivity PFM measurements using a variety of advanced and proprietary measurement techniques and capabilities.
Now with the Interferometric Displacement Sensor (IDS) Option for the Cypher AFM, d33 measurements are more reproducible and artifact-free. Interferometric detection directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling. Learn how IDS improves PFM measurements by downloading the white paper below.
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"Higher-eigenmode piezoresponse force microscopy: a path towards increased sensitivity and the elimination of electrostatic artifacts," G. A. MacDonald, F. W. DelRio, and J. P. Killgore, Nano Futures 2, 015005 (2018). https://doi.org/10.1088/2399-1984/aab2bc
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"Tunnel electroresistance in junctions with ultrathin ferroelectric Pb(Zr0.2Ti0.8)O3 barriers," D. Pantel, H. Lu, S. Goetze, P. Werner, D. J. Kim, A. Gruverman, D. Hesse, and M. Alexe, Appl. Phys. Lett. 100, 232902 (2012). https://doi.org/10.1063/1.4726120
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"Enhanced multiferroic properties and domain structure of La-doped BiFeO3 thin films," F. Yan, T. J. Zhu, M. O. Lai, and L. Lu, Scr. Mater. 63, 780 (2010). https://doi.org/10.1016/j.scriptamat.2010.06.013
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"Piezoelectric and semiconducting coupled power generating process of a single ZnO belt/wire. A technology for harvesting electricity from the environment," J. Song, J. Zhou, and Z. L. Wang, Nano Lett. 6, 1656 (2006). https://doi.org/ 10.1021/nl060820v