Part of the Oxford Instruments Group
The Cypher Family delivers industry-leading AFM performance built on an ultra‑stable, low‑noise platform - enabling fast,& high‑resolution imaging and broad research versatility across materials science and life science disciplines.
Request PricingThe Cypher AFM Family consists of four models: the Cypher L, Cypher S, Cypher ES, and Cypher VRS1250. Each model builds upon the capabilities of the preceding models, enabling you to choose the configuration that best suits your research and budget while also providing a path for future upgrades. Every model shares the same strong core foundation of performance, versatility, and ease of use.
Routinely achieve higher resolution
A compact ultra-stable design with a noise floor 50% lower than most competitors easily resolves molecular or atomic features that are difficult or impossible to see on typical AFMs.
Exceptional research versatility
Enabled by the industry’s widest range of operating modes and modular accessories supporting electrical, mechanical, functional, and environmental studies across materials science and life science applications.
Fast scanning comes standard
Cypher L, S and ES acquire images 10-40× faster than conventional AFMs, while our Cypher VRS1250 delivers true video-rate imaging up to 45 frames/s.
Productivity-boosting ease of use
Motorized setup and operation, optional blueDrive photothermal excitation, and streamlined workflows in our Ergo operating software with advanced AutoPilot algorithms help every user achieve outstanding results.
The most accessible entry point to world class AFM performance, providing high-resolution core imaging today with a future-proof upgrade path to more advanced Cypher models.
The gold standard for ultra high performance AFM, offering <15 pm noise floor, up to 40× faster scanning, and comprehensive electrical, mechanical, and functional imaging modes—ideal for 2D materials and piezo/ferroelectric materials research.
The first AFM engineered specifically for exceptional environmental control, featuring a fully-sealed sample chamber with modular options for operation in controlled gases or liquids, sample heating and cooling, humidity control, and electrochemistry. Perfect for investigating polymers, energy materials, surface chemistry, biomolecules, and biomembranes.
The first and only full-featured video-rate AFM, capturing images at up to 45 frames/s while maintaining unrivaled versatility. Break new ground visualizing nanoscale dynamics and empower your group to tackle the most demanding multidisciplinary research
Since we got the Cypher we are glued to it. We love the resolution, the reliability and… the blueDrive! It is allowing us to make quantitative measurements on a whole range of biological systems from single molecules to plant tissues. The Cypher is inspiring us to try many things that we would have not tried otherwise.
Professor Sonia Contera, University of Oxford, United Kingdom
Cypher is truly the first third-generation AFM. The Asylum Research folks have looked at everything that limited AFM performance in the past and addressed all of them in this new design. Cypher has better resolution, less noise, less drift, is more accurate, is able to scan faster and, on top of that, is the easiest to use AFM I have ever seen.
Professor Bruce Parkinson, University of Wyoming (USA)
Asylum’s Cypher is clearly the best choice for polymer research. When I compared Cypher to the alternatives, it became very obvious that Asylum Research is far ahead of their competitors in pushing the limits of AFM performance and developing tools for nanomechanical measurements.
Professor Ken Nakajima, Tokyo Institute of Technology (Japan)
Cypher is one fantastic AFM. It sets the standard for both resolution and ease of use. It makes routine characterization easy and opens many possibilities for high resolution imaging. We're really excited to have this instrument in our lab.
Professor Ray Dagastine, University of Melbourne (Australia)
Cypher is by far the best, most stable and most configurable AFM I have ever used.
Andras Kis, EPFL Switzerland
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Cypher AFMs are widely used by leading research groups for the fabrication and characterization of van der Waals heterostructures. Their exceptional stability, high resolution, and fast-scanning performance make them ideal for common use cases, including:
Recommendation: Cypher L or Cypher S are most commonly used.
Moiré patterns formed by twisted bilayer graphene on hexagonal boron nitrade, imaged using conductive AFM on a Cypher S. Image courtesy of S. Zhang, Tsinghua University.
Moiré patterns formed by near-magic-angle twisted bilayer graphene, imaged using Torsional Force Microscopy on a Cypher S Sample. Image courtesy of Young Lab, University California Santa Barbara.
Scientists at Oxford Instruments Asylum Research, in collaboration with leading research groups, have developed powerful AFM tools for characterizing piezo- and ferro-electric materials. Cypher AFMs, with their ultra-low-noise performance and exceptional versatility, enable:
Recommendation: Cypher S (See also Vero S for even more advanced PFM capabilities).
DART PFM images of multiferroic BiFeO3 nanofibers, 1 µm scams. The amplitude image on the left shows the magnitude of the vertical response. The phase image on the right shows the polarization of the response. Collaboration with S. Xie, Xiangtan University and J.Y. Li, University of Washington.
Cypher AFMs are optimized for polymer research and R&D, combining ultra‑low noise, advanced nanomechanical modes, and precise environmental control for formulation, composite development, and process optimization. They enable:
Recommendation: Cypher ES Polymer Edition includes a package of commonly used tools for polymer research.
Crystalline lamella in polyethylene are visible in this AM-FM stiffness image. The measured 0.89 nm spacing is consistent with known polymer chain packing.
Modulus map of a multilayer polymer film generated by AM-FM Viscoelastic Mapping Mode. From left to right, we see layers of polyethylene terephthalate, an adhesive layer, polyethylene, and ethylene vinyl alcohol.
Cypher AFMs are equally well suited for life science applications, offering ultra‑high‑resolution imaging in liquid, stable blueDrive photothermal excitation, and fully sealed sample cells (Cypher ES and VRS1250) for controlled liquid environments and perfusion. These capabilities support:
Recommendation: Cypher ES for controlled liquid operation and perfusion; Cypher VRS1250 for video-rate dynamic studies.
F-actin filaments, imaged in tapping mode, 340 nm scan. The measured helical pitch is 37.8 nm, consistent with literature values. Sample courtesy E. Reisler, UCLA.
Mixed lipid bilayers (50-50 DOPC:DPPC), imaged in tapping mode using blueDrive, 3 µm scan. The DPPC phase is ~1.3 nm thicker than the DOPC phase.
Cypher AFMs lead the charge when it comes to development of next-generation energy materials including batteries and photovoltaics. Many energy materials are air/water-sensitive, so the exceptional environmental control of the Cypher ES and the outstanding performance of Cypher AFMs in gloveboxes set these AFMs apart from others. A versatile toolbox of nanoelectrical, nanomechanical, and electrochemical techniques enable:
Recommendation: Cypher ES Battery Edition includes a package of commonly used tools for battery research. The Cypher ES is also commonly used for photovoltaics research.
SEI formation during voltage cycling on a HOPG electrode in lithium hexafluorophosphate electrolyte. Colored segments labelled A through I in the central Cyclic Voltammogram correspond to the voltage ranges during which the corresponding images labelled A through I were acquired. The series of 4 µm images were acquired on a Cypher ES. Data courtesy of K.J. Stevenson, Skolkovo Institute of Science and Technology.
All Cypher models can be operated inside a glovebox for characterization of air- and water-sensitive materials like battery materials (e.g. lithium) and 2D materials (e.g. black phosphorus). We recommend a glovebox configuration developed together with MBraun that has a specially reinforced base for superior vibration isolation. Together with Cypher’s inherently high noise immunity, the design guarantees that Cypher will meet all its performance specifications without added vibration isolation even while the glovebox blower and vacuum pumps are running. However, interface kits can also be provided for other glovebox models.
Cypher maintains its full performance and ease of use even in a glovebox.
The sealed liquid cell provides a completely enclosed liquid environment constructed from chemically inert materials. It equilibrates quickly and prevents evaporation, and the sealed design prevents liquid from reaching the scanner during imaging. It can also be used together with Heater-Cooler stage for heating or cooling in liquid.
For Cypher L and S, the droplet liquid probe holder supports imaging directly in a small liquid droplet placed on the sample surface, providing a simple, reliable method for routine liquid imaging.
The Electrochemistry (EC) Cell enables in situ AFM studies of electrochemical processes in a controlled liquid environment. Based on the modular ES/VRS1250 sample chamber design and constructed from highly chemical-resistant materials, it consists of a cell holding the working electrode surface, a circular counter electrode, and reference electrode. Electrical connections route through the cell body without breaking the seal and route to a customer-supplied potentiostat.
The sharp tip of the AFM probe is essential for resolving nanoscale topography. When that same tip is used as an electrode, it unlocks the potential for powerful nanoelectrical and electromechanical measurements. With Cypher’s exceptional mechanical stability and low noise electronics, researchers achieve highly sensitive, high spatial resolution insights into surface potential, charge distribution, conductivity, capacitance, and piezoelectric response.
KPFM quantitatively measures surface potential and reveals nanoscale variations in work function. The KPFM toolkit in Ergo lets users seamlessly switch among Heterodyne, Sideband, and Amplitude‑Modulated KPFM to handle everything from smooth semiconductor devices to rough polymer films. All three are single‑pass techniques, capturing topography and surface potential simultaneously for faster imaging and reduced artifacts compared with older dual‑pass implementations.
Self-assembled structures of a semifluorinated alkane, F(CF2)14(CH2)20H, on silicon. The highly polar molecules result in strong contrast in Kelvin Probe Force Microscopy (KPFM). Color scale is ±220 mV.
CAFM maps nanoscale variations in conductivity arising from features such as material composition, dopant levels, and grain boundaries. Unlike some AFMs that depend on heavy electronic filtering—which reduces bandwidth and forces very slow scan rates—Cypher’s CAFM performance is limited primarily by the intrinsic Johnson noise of the circuit, even at scan speeds up to ~5× faster. For applications requiring a broader dynamic range, the Dual Gain CAFM option uses two overlapping linear amplifiers to capture currents from pA to 10 µA in a single pass while maintaining the low noise floor that logarithmic SSRM-style amplifiers typically cannot match.
Moiré pattern in twisted HOPG layers imaged using conductive AFM under ambient conditions. The atomic lattice is also clearly visible. Image courtesy of S. Sumaiya and M. Baykara, Univ. California, Merced.
SCM measures local capacitance and differential capacitance (dC/dV) to reveal dopant type, concentration, and electronic structure at the nanoscale. Cypher’s SCM implementation is different than most because it can measure true capacitance—down to 1 aF—not just dC/dV, providing a linear, quantitative signal that broadens SCM use beyond traditional semiconductor materials—extending it even to materials without an oxide layer. Its high-bandwidth RF design supports scan rates up to 20× faster than conventional SCM. This combination of speed, sensitivity, and expanded material compatibility makes Cypher one of the most advanced SCM platforms available
Gate feature of the SRAM sample imaged with SCM. a) dC/dV Amplitude image showing dopant level and b) dC/dV phase image showing dopant type.
PFM measures the electromechanical response of piezoelectric and ferroelectric materials, enabling visualization of domains and detailed studies of switching behavior. Cypher AFMs deliver exceptional PFM performance because patented Dual AC Resonance Tracking (DART) PFM maximizes sensitivity through resonance amplification while avoiding the artifacts caused by shifting contact-resonance frequencies in conventional resonance-based PFM. For materials with weak piezoresponse or requiring high switching fields, Cypher systems can be equipped with a fully integrated high-voltage option that applies biases up to ±150 V, complete with fail-safe interlocks to ensure user safety. These capabilities deliver higher signal-to-noise, reduced topographic crosstalk, and more reliable measurements on both strong and weak piezoelectric materials, making Cypher an outstanding platform for nanoscale ferroelectric and piezoelectric characterization.
Hafnium Oxide thin film imaged with DART PFM. Amplitude (top) and phase (bottom) data overlaid on a 3D representation of the surface topography (3 µm scan size).
AFM imaging is inherently based on the mechanical interaction between the sharp probe tip and the sample surface. As the tip traces topography, it also responds to local variations in tip–sample stiffness, adhesion, and dissipation—signals that can be quantified to extract viscoelastic properties such as elastic modulus and loss tangent using appropriate contact mechanics models. Because no single technique is optimal for all materials or mechanical regimes, Cypher AFMs offer a comprehensive nanomechanical toolkit -including force-curve-based, tapping-mode-based, and contact-resonance-based methods—that span materials from soft biomaterials and polymers to composites, thin films, metals, and ceramics.
Fast Force Mapping (FFM) is a straightforward, force‑curve–based nanomechanical imaging mode in which the AFM tip indents the sample at every pixel, allowing the calculation of elastic modulus, adhesion, and more. Unlike traditional force‑volume imaging, which can take more than an hour, FFM uses a continuous sinusoidal Z‑motion to acquire force curves rapidly, enabling full‑resolution maps to be collected at normal imaging rates.
Some competing implementations infer tip-sample separation rather than measuring the calibrated Z sensor, heavily filter signals, save only a single pre‑processed modulus channel, and then discard the raw curves, Instead, Asylum’s FFM captures the complete, unfiltered force‑distance data at every pixel by default—including cantilever deflection, Z‑sensor displacement, and, when enabled, current for CAFM current mapping.
By preserving the full dataset, researchers can apply and compare multiple contact mechanics models—Hertz/Sneddon, DMT, JKR, Oliver–Pharr—or even implement their own. This flexibility is essential for handling the wide variety of materials, indentation depths, adhesion regimes, and viscoelastic behaviors encountered in real‑world samples
Polystyrene-polypropylene polymer blend thin film imaged using Fast Force Mapping mode. Elastic modulus is shown on 3D topography, 6 μm scan.
AM‑FM is a fast, tapping‑based nanomechanical technique that measures elastic modulus and viscoelastic response (loss tangent) by driving two cantilever resonances simultaneously. Because it’s based on tapping mode, AM‑FM can acquire quantitative mechanical maps at fast-scanning tapping scan rates up to 20 Hz.
While many users prefer the intuitive, indentation‑based operation of Fast Force Mapping, AM‑FM offers several advantages—especially on Cypher systems equipped with blueDrive photothermal excitation, where clean, stable excitation makes setup simple and measurements highly reproducible. AM‑FM’s frequency‑shift‑based analysis also provides a very wide modulus range using a single cantilever, making it ideal for thin films, polymer blends, composites, and biomaterials.
And because AM‑FM measures loss tangent, it adds valuable viscoelastic contrast that complements FFM’s force‑curve‑based quantification, giving researchers a fast, gentle, and information‑rich alternative mode.
ABS polymer formed by fused filament additive manufacturing imaged using AM-FM Viscoelastic Mapping Mode shows fewer and smaller rubbery butadiene particles along the weld (dashed lines), which may reduce its fracture toughness. Image courtesy of C. Brinson, Duke Univ.
Contact Resonance is a quantitative nanomechanical technique that measures elastic modulus and viscoelastic loss modulus by tracking how the contact‑resonance frequency and quality factor (Q) shift as the tip scans in contact with the sample. Because these frequency shifts are extremely sensitive to stiffness, Contact Resonance is especially powerful for moderate‑ to high‑modulus materials such as thin films, composites, metals, and ceramics.
Asylum’s implementation, based on DART contact resonance, continuously tracks both frequency and Q at normal scanning speeds, providing fast, stable mapping without the slow point‑by‑point sweeps used in some systems. When equipped with blueDrive photothermal excitation, Cypher systems achieve exceptionally clean, stable drive response, improving quantitative accuracy and ease of use.
Compared with FFM and AM‑FM, Contact Resonance excels when higher stiffness, higher‑modulus ranges, or more detailed viscoelastic information are required—making it a complementary tool for comprehensive nanomechanical characterization.
Patterned sample consisting titanium squares on a silicon substrate imaged using Contact Resonance Viscolelastic Mapping mode using blueDrive photothermal excitation. Shown is the calibrated modulus data overlaid on the 3D topography (Si ~ 165 GPa, Ti ~ 110-125 GPa). Scan size is 25 µm. Sample courtesy of Donna Hurley, National Institute of Standards and Technology (NIST).
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