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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties

Cypher Accessories: Nanoelectrical Properties

Products

ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA.…

Conductive AFM (ORCA)

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

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The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics.…

High-Voltage Piezoresponse Force Microscopy (PFM)

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The  Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample…

Electrochemistry Cell

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sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

Scanning Microwave Impedance Microscopy (sMIM)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring…

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

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STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the…

Scanning Tunneling Microscopy (STM)

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ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with…

Electrochemical Strain Microscopy (ESM)

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