Cypher Accessories: Nanoelectrical Properties

Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal…

ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges…

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical…

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes…

The  Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and standard…

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through…

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.