Part of the Oxford Instruments Group

Interferometric Displacement Sensor (IDS)

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling, enabling measurements that are more reproducible and accurate, especially for piezoresponse force microscopy (PFM) and d33 measurements.

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