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  1. AFM Home
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  3. Vero Family of AFMs
  4. Vero S: Interferometric AFM

Vero S: Interferometric AFM

2024 R&D 100, Frost & Sullivan Award Winner: Asylum Research's Vero Interferometric AFM
Vero AFM viewed from an angle.
Vero AFM with front open.

The Vero S is the standard ambient configuration of Asylum’s next-generation Vero AFMs, which precisely and accurately measure true tip displacement using Quadrature Phase Differential Interferometry (QPDI).

Quadrature Phase Differential Interferometry:

  • Measures true tip displacement
  • Improves measurement sensitivity
  • Avoids crosstalk between vertical and in-plane forces
  • Is precisely calibrated by the wavelength of light

Vero S features:

  • Routinely achieves higher resolution than other AFMs
  • Fast scanning with results in seconds instead of minutes
  • blueDrive photothermal excitation for simpler, more stable tapping mode imaging (optional)


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The Vero S builds on the ultra-high stability and performance of the Cypher S, while adding the benefits of Quadrature Phase Differential Interferometry (QPDI), which is unique to the next-generation Vero AFM Family.

Routinely achieve higher resolution than other AFM microscopes

  • Unmatched mechanical stability—noise floor half that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources

Fast scanning with results in seconds instead of minutes

  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Vero ES for environmental control accessories and to Vero VRS1250 for video-rate imaging
  • Many standard operating modes and even more optional modes

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training

Measures true tip displacement

  • QPDI directly measures true tip displacement instead of cantilever angle, enabling improved quantification of many AFM measurements.

Improves measurement sensitivity

  • QPDI lowers cantilever detection noise by a factor of up to 10× or more on many cantilevers, enabling improved measurement sensitivity.

Avoids crosstalk between vertical and in-plane forces

  • Only QPDI measures pure vertical tip displacement, avoiding the large crosstalk between OBD vertical and lateral deflection signals.

Is precisely calibrated by the wavelength of light

  • Interferometric detection avoids the assumptions and uncertainties associated with OBD calibration.

Included Operating Modes

Contact mode
DART PFM
Dual AC (Bimodal) 
Dual AC Resonance Tracking (DART)
Electric force microscopy (EFM)
Force curves
Force mapping mode (force volume)
Force modulation
Frequency modulation
Kelvin probe force microscopy (KPFM)
Lateral force mode (LFM)
Loss tangent imaging
Magnetic force microscopy (MFM)
Nanolithography and nanomanipulation
Phase imaging
Piezoresponse force microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode*
Contact Resonance Viscoelastic Mapping Mode*
Fast Force Mapping Mode (FFM)
Conductive AFM (CAFM) with ORCA
Current mapping with FFM
Electrochemical Strain Microscopy (ESM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Capacitance Microscopy (SCM)
Scanning microwave impedance microscopy (sMIM)
Scanning tunneling microscopy (STM)

(*these modes are included if Vero S is equipped with blueDrive or can be supported with optional piezo-driven probe or sample actuators)

The Vero S supports the same optional modes and accessories as the Cypher S
Nanomechanical and Thermal Properties

Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of thermal properties.


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Nanoelectrical and Electrochemical Properties

Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, STM, and EC-AFM techniques.

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Temperature and Other Environmental Control

Accessories for controlling temperature, the gas environments (gas/vapor composition or humidity), and operating under ultra-low oxygen and/or water levels in a glovebox.

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Operating in Liquid Environments

Accessories for operation in controlled liquid environments, with or without perfusion. The blueDrive photothermal excitation option is also under this accessory family.

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Support and Service Agreements

More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users.
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Discover how to get more from Vero...

Vero Application Note:
Contact Mode Redefined
Vero Application Note:
Improved AFM Accuracy
Vero Application Note:
Improved AFM Precision
Vero Technical Note:
QPDI Explained

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