Part of the Oxford Instruments Group

AFM for Polymer Science

Modulus map of a polymer blend

Polymers are ubiquitous in everyday life and the subject of much materials research. Polymer properties are varied and atomic force microscopy is an excellent tool to study them on many levels. In addition to accurate measurement of polymer film topography, the wide range of AFM techniques available on Asylum Research instruments allows for study of diverse polymer properties ranging from molecular chain arrangement in crystallites to domain modulus and conductivity.

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  • Surface morphology and roughness measurements
  • Quantitative nanomechanical properties including viscoelasticity (AM-FM and CR-DART)
  • Fast imaging for observation of crystallization and melting processes
  • Controlled heating and cooling of samples
  • Electrical measurements such as photoconductivity and electrochemical strain
  • Environmental control of gas type and humidity around the sample
  • Thermal analysis (Ztherm)
  • Built-in lithography tools
  • Single molecule force spectroscopy experiments

Common Uses

  • Nanomechanical (modulus, viscoelasticity) properties of components in polymer blends and polymer composites
  • Commercial packaging quality testing
  • Measurement of layer thickness and uniformity
  • Material strain testing
  • Organic electronics - photoconductivity of organic solar cells
  • Single chain polymer stretching  
  • Thermal phase transitions- melting and crystallization

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