Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
Jupiter AccessoriesVariable Magnetic Field ModuleNanoRack Sample Stretching StageScanning Capacitance Microscopy (SCM)PolyHeaterCoolerHeaterImaging in LiquidConductive AFM
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Probes
Probe Stores
US & CanadaEuropeAsiaLatin America, New Zealand, Hong Kong, UAE, Saudi ArabiaChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
Webinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
Shop
UKEuropeUS & CanadaJapanAsiaChina
Our Asia Online Store is live. Visit for consumables, spares, software and training. Launching soon: Japan
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. MFP-3D Accessories: Nanomechanical and Thermal Properties

MFP-3D Accessories: Nanomechanical and Thermal Properties

Products

AM-FM mode on MFP-3D AFMs combines the features and benefits of normal tapping mode with nanomechanical property mapping. Normal tapping mode provides non-invasive,…

AM-FM Viscoelastic Mapping Mode

Find out more

Force-distance curve mapping technique that operates at up to 300 Hz pixel rate and captures every force curve in the image with real-time and offline models for…

Fast Force Mapping Mode

Find out more

Contact Resonance Viscoelastic Mapping Mode for MFP-3D AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa…

Contact Resonance Viscoelastic Mapping Mode

Find out more

Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity…

Scanning Thermal Microscopy (SThM)

Find out more

Learning Centre Assets

Measuring Etch Undercut: Seeing Below the Surface
2D Materials Create Ultrathin Heat Shields

© Oxford Instruments 2021

Website by Miramar Communications Ltd