Part of the Oxford Instruments Group

NanoRack Sample Stretching Stage

Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can be simultaneously observed with the AFM. The stage features a large range to achieve high strains and an integrated load cell to measure high stresses with forces up to 80 N. (Compatible with Jupiter XR AFM as well as all MFP-3D AFM's except for Origin.)

  • High-strain, high-travel manual stretching stage provides two axis tensile stress control

  • Returns both stress and strain data

  • Can be used under tension or compression

  • Allows control of the sample image region under different loads

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