Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS1250 Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
AFM Accessories
Jupiter AccessoriesAM-FM Viscoelastic Mapping ModeFast Force Mapping (FFM)Variable Magnetic Field ModuleNanoRack Sample Stretching StageScanning Capacitance Microscopy (SCM)PolyHeaterCoolerHeaterImaging in LiquidConductive AFM
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Application
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
WebinarsOnline Symposium: Applications of Atomic Force Microscopy in Polymer Research
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
AFM Probes
Probe Stores
US & CanadaUKEuropeAsiaJapanChina
Probe Selection Guide
Need Help Choosing a Probe?
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. Jupiter AFM Accessories

Jupiter XR AFM Accessories and Modes

AM-FM Viscoelastic Mapping Mode

Tapping mod-based nanomechanical mapping mode.

Learn More >
NanoRack

Sample stage for experiments under tension or compression.

Learn More >
PolyHeater

Sample heating up to 300°C with the PolyHeater accessory.

Learn More >
Fast Force Mapping

Force curve-based nanomechanical mapping mode.

Learn More >
Scanning Capacitance Microscopy (SCM)

Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.

Learn More >
Conductive AFM

Conductive AFM imaging with the new ORCA cantilever holder.

Learn More >
Variable Magnetic Field Module

Variation of magnetic field: in-plane and out-of-plane of the sample.

Learn More >
CoolerHeater

Sub-zero temperature control with the CoolerHeater accessory.

Learn More >
Imaging in Liquid

Droplet imaging with the new liquid cantilever holder.

Learn More >

© Oxford Instruments 2021

Website by Miramar Communications Ltd