Part of the Oxford Instruments Group
Nanoscale Time Dependent Dielectric Breakdown experiements up to ±150 V.
Force curve-based nanomechanical mapping mode.
Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.
Conductive AFM imaging with the new ORCA cantilever holder.
High voltage operation up to ±150 V.
Variation of magnetic field: in-plane and out-of-plane of the sample.
Sub-zero temperature control with the CoolerHeater accessory.
Sample heating up to 300°C with the PolyHeater accessory.
© Oxford Instruments 2023