Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM Software
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
eCommerce
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Adapting to Experimental Needs

MFP-3D Accessories: Adapting to Experimental Needs

Products

A variety of sample mounts are available for MFP-3D AFMs in addition to the standard magnetic mount and clip mount. These include mounts for SEM stubs and coverslips.

Sample Mounts

Find out more

The MFP-3D Extended Z-Range Head provides 40 µm Z range for imaging tall samples and long-range force measurements, with very minimal degradation of imaging performance (atomic resolution…

Extended Z-Range Head

Find out more

The MFP-3D Leg Extenders raise the scan head to allow imaging of thicker samples up to 30 mm in height (inquire about thicker samples).

Leg Extenders for Support of Thicker Samples

Find out more

The Digital Access Module provides digital I/O to the controller for applications such as photon counting and synchronization to the AFM scan. The Extended…

Digital Access Module and Extended Digital Interface Module

Find out more

The High Bandwith Photodiode Option upgrades vertical and horizontal signal detection bandwidth to >5 MHz on MFP-3D AFMs. The high bandwidth signal is available…

High Bandwidth Photodiode Option

Find out more

The Vacuum Chuck for MFP-3D AFMs allows flat samples to be held without any mechanical contacts to the top surface and with no adhesives on the bottom surface. The…

Vacuum Sample Chuck

Find out more

© Oxford Instruments 2019

Website by Miramar Communications Ltd