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  1. AFM Home
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  4. Jupiter Discovery AFM

Jupiter Discovery AFM

Brochure

The Jupiter Discovery Atomic Force Microscope offers a unique combination of best-in-class performance along with exceptional ease of use. Whether in academia or industry, researchers expect high quality results with less training and effort. At the same time, today’s AFM measurements demand higher performance as users strive to resolve finer details and achieve higher accuracy, repeatability, and throughput. The Jupiter Discovery is the only AFM that meets these needs, delivering both the ultra-high performance and the exceptional usability that researchers need.

  • Next-Generation Design Delivers the Ultimate Performance

  • Optimized Workflow for Simpler and More Productive User Experience

  • Unmatched Configurability Satisfies Diverse Research Needs


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Next-Generation AFM Design Delivers the Highest Performance of Any Large-Sample AFM

  • Jupiter Discovery achieves ultra-high resolution and scan rates 5-20× faster than other AFMs, setting a new performance benchmark for large-sample AFMs.

Optimized Workflow Provides a Simpler and More Productive User Experience

  • Pre-mounted probes, a unique side-view camera, and exclusive FFM Topography imaging mode with Autopilot enable new users to go from sample loading to results in mere minutes.

Unmatched Configurability Provides the Versatility to Meet the Needs of Any Research Group

  • A vast selection of accessories and capabilities enables multidisciplinary research, while configuration options help span a wider range of research budgets.

Included Operating Modes

Basic Modes
Contact mode
Fast Force Mapping Topography with Autopilot
Force curves
Frequency modulation
Lateral force mode (LFM)
Nanolithography and nanomanipulation
Phase imaging
Tapping mode (AC mode)

Nanomechanical Modes
Dual AC (Bimodal)
Force mapping mode (force volume)
Force modulation
Loss tangent imaging

Nanoelectrical and Functional Modes
Electric force microscopy (EFM)
Kelvin probe force microscopy (KPFM)
Magnetic force microscopy (MFM)
Dual AC Resonance Tracking (DART) piezoresponse force microscopy (PFM)
Switching spectroscopy PFM
Vector PFM.

Optional Operating Modes

Nanomechanical Modes
AM-FM Viscoelastic Mapping Mode (requires blueDrive)
Contact Resonance Viscoelastic Mapping Mode (requires blueDrive)
Fast Force Modulus Mapping (FFM-Modulus)
Torsional Force Microscopy (TFM) (blueDrive suggested)

Nanoelectrical and Functional Modes
Conductive AFM (CAFM) with ORCA
Current mapping with Fast Force Mapping
Ergo KPFM (single pass with heterodyne, sideband, and amplitude modulation)
Nanoscale Time-Dependent Dielectric Breakdown (nanoTDDB)
Scanning Capacitance Microscopy (SCM).

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