Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM Software
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
eCommerce
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties

MFP-3D Accessories: Nanoelectrical Properties

Products

The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module…

Conductive AFM (ORCA)

Find out more

The Piezo Force Module enables operation at high tip biases up to ±220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics…

Piezoresponse Force Microscopy (PFM)

Find out more

The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. The cell…

Electrochemistry Cell for MFP‑3D AFMs

Find out more

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

Scanning Microwave Impedance Microscopy (sMIM)

Find out more

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current…

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

Find out more

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.

Scanning Tunneling Microscopy (STM)

Find out more

ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.…

Electrochemical Strain Microscopy (ESM)

Find out more

© Oxford Instruments 2019

Website by Miramar Communications Ltd