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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties

MFP-3D Accessories: Nanoelectrical Properties

Products

The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module…

Conductive AFM (ORCA)

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The Piezo Force Module enables operation at high tip biases up to ±220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics…

Piezoresponse Force Microscopy (PFM)

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The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. The cell…

Electrochemistry Cell for MFP‑3D AFMs

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sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

Scanning Microwave Impedance Microscopy (sMIM)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current…

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

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STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.

Scanning Tunneling Microscopy (STM)

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ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.…

Electrochemical Strain Microscopy (ESM)

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