Part of the Oxford Instruments Group

Expand

Collapse

Oxford Instruments

Sustainability Investors Careers News Events

cn
jp

cn
jp

Investors Careers

AFM Systems

VERO FAMILY AFM Vero S Vero ES Vero VRS1250

Jupiter Family AFM Jupiter Discovery AFM

Cypher Family AFMs Cypher L AFM Cypher S AFM Cypher ES Battery Edition AFM Cypher ES Environmental AFM Cypher ES Polymer Edition AFM Cypher VRS1250 Video-Rate AFM

MFP-3D Family AFMs MFP-3D Origin AFM MFP-3D Origin+ AFM MFP-3D-BIO AFM

AFM Accessories

Jupiter Accessories Ergo Advanced Automation Ergo KPFM High Voltage Options AM-FM Viscoelastic Mapping Mode Fast Force Mapping (FFM)Variable Magnetic Field Module NanoRack Sample Stretching Stage Scanning Capacitance Microscopy (SCM)PolyHeater CoolerHeater Imaging in Liquid Conductive AFM

Cypher Accessories blueDrive Photothermal Excitation Interferometric Displacement Sensor (IDS)Measuring Nanomechanical and Thermal Properties Measuring Nanoelectrical and Electrochemical Properties Controlling Temperature and Gas Environment Operating in Liquid Environments AFM Probes / Cantilevers

MFP-3D Accessories Measuring Nanomechanical and Thermal Properties Measuring Nanoelectrical and Electrochemical Properties Controlling Temperature and Gas Environment Operating in Liquid Environments Subjecting Samples to Other Driving Forces Adapting to Your Experimental Needs AFM Probes / Cantilevers

AFM Software AR Maps Ergo AFM Software Relate: software for correlative imaging with AFM, EM, EDS, and EBSD

Polymers Thin Films and Coatings Piezo and Ferroelectrics Graphene and 2D Materials

Biomolecules, Membranes, and Assemblies Cells and Tissues Biomaterials Food Science

Solar, Photovoltaics, and Thermoelectrics Energy Storage Semiconductors and Microelectronics Magnetics and Data Storage

Nanomechanical Characterization Nanoelectrical Characterization Force Measurements Tribology Development of Custom AFM Instrumentation

AFM Image Gallery

Learning

Materials

Application Notes Case Studies Virtual PFM Academy Webinars

Contact Us

Sales Inquiries

Contact Your Local Sales Engineer Request Product and Pricing Information

Customer Support

Get AFM Support Now Ask for Help on the User Forum Support and Service Agreements

Probe Stores

US & Canada UK Europe Asia Japan China

News

Events

eCommerce

AFM Image Gallery: Cypher Atomic Resolution

Repeated single point atomic defect on calcite imaged with blueDrive

C8-BTBT

Calcite

True atomic resolution

Celgard sample

Open in a new tab

Copyright Statement
Sustainability
Modern Slavery

Gender Pay Report
Regulatory Information
Terms & Conditions of Use

Privacy
Disclaimer
Sitemap

© Oxford Instruments 2025

Website by Miramar Communications Ltd