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  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanomechanical and Thermal Properties
  4. Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

Icon representing scanning thermal microscopy (SThM)

Novel microfabricated silicon probes and the SThM probe holder for Cypher AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.


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Thermomechanical Nanoindentation
Scanning Thermal Microscopy (SThM)
Cypher ES Environmental AFM
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