Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Cypher atomic force microscope family thumbnail
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D atomic force microscope family thumbnail
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Support
Contact Your Local Sales EngineerRequest Product and Pricing Information
Product and Applications Support
Get AFM Support NowAsk for Help on the User ForumSupport and Warranty Policies
News
Events
Contact
Explore OI
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanomechanical and Thermal Properties
  4. Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

Icon representing scanning thermal microscopy (SThM)

Novel microfabricated silicon probes and the SThM probe holder for Cypher AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.


Request Pricing Add to quote list

You may also be interested in...

Thermomechanical Nanoindentation
Scanning Thermal Microscopy (SThM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

Related Applications

Failure Analysis

© Oxford Instruments 2019

Website by Miramar Communications Ltd