Part of the Oxford Instruments Group

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

NanoTDDB enables characterization of dielectric breakdown with nanoscale precision on Jupiter XR AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.​

  • The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations
  • Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed

*nanoTDDB is an optional accessory upgrade for Jupiter XR AFM

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