Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
Sustainability Investors Careers News Events
Investors Careers
  1. AFM Home
  2. AFM Systems and Accessories
  3. MFP-3D Accessories: Nanomechanical and Thermal Properties
  4. Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM) image of the R/W head from a commercial hard drive. SThM data is overlaid as color on the rendered surface topography, with darker regions exhibiting higher thermal conductivity. The difference in temperature between the yellow and orange regions is ~0.02°C. Polishing lines are clearly resolved in the topography. Imaged with the MFP-3D, 8.5µm scan.
MFP-3D AFM
Brochure

Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.


Request Pricing Add to quote list

You may also be interested in...

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode (FFM)

Upcoming events

May
28
KSM Spring Conference
Location:
Yonsei University, Seoul, Korea
Businesses Attending:
Andor, Asylum Research, NanoAnalysis, WITec | Raman
View Event >
Jun
15
Canadian Chemistry Conference and Exhibition
Location:
Ottawa, ON | Canada
Businesses Attending:
Asylum Research, Magnetic Resonance, NanoAnalysis, WITec | Raman
View Event >

Latest news

Oxford Instruments Asylum Research Releases New Vero VRS1250 Atomic…

Oxford Instruments Asylum Research announced today the release of the new…

Read full article >
Oxford Instruments Asylum Research Receives R&D 100 and Frost & Sullivan…

The Vero AFM is now an award winner! Vero's recent accolades include: 2024…

Read full article >
Powerful AFM Offline Analysis Software Now Available for Oxford Instruments…

AR Maps is a new and powerful software analysis package for the Jupiter…

Read full article >
New Advanced Automation and Usability Features on the Jupiter AFM

Announcing the release of new features for the Jupiter XR AFM to increase…

Read full article >

© Oxford Instruments 2025

Website by Miramar Communications Ltd