Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS1250 Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
AFM Accessories
Jupiter AccessoriesAM-FM Viscoelastic Mapping ModeFast Force Mapping (FFM)Variable Magnetic Field ModuleNanoRack Sample Stretching StageScanning Capacitance Microscopy (SCM)PolyHeaterCoolerHeaterImaging in LiquidConductive AFM
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Application
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
Webinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
AFM Probes
Probe Stores
US & CanadaUKEuropeAsiaJapanChina
Probe Selection Guide
Need Help Choosing a Probe?
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. MFP-3D Accessories: Nanomechanical and Thermal Properties
  4. Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM) image of the R/W head from a commercial hard drive. SThM data is overlaid as color on the rendered surface topography, with darker regions exhibiting higher thermal conductivity. The difference in temperature between the yellow and orange regions is ~0.02°C. Polishing lines are clearly resolved in the topography. Imaged with the MFP-3D, 8.5µm scan.
MFP-3D AFM
Brochure

Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.


Request Pricing Add to quote list

You may also be interested in...

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode (FFM)

Latest news

Oxford Instruments announces first Virtual Symposium on Quantum Technology,…

Oxford Instruments announces first Virtual Symposium on Quantum Technology,…

Read full article >
Fast Force Mapping (FFM) nanomechanical mode on Jupiter XR, Large…

Fast Force Mapping (FFM) nanomechanical mode on Jupiter XR, Large Sample…

Read full article >
New Cypher VRS1250 Video-Rate Atomic Force Microscope Enables True…

New Cypher VRS1250 Video-Rate Atomic Force Microscope Enables True Video-Rate…

Read full article >
Oxford Instruments Asylum Research Releases Variable Magnetic Field…

Oxford Instruments Asylum Research Releases Variable Magnetic Field Module…

Read full article >

© Oxford Instruments 2021

Website by Miramar Communications Ltd