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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanomechanical and Thermal Properties
  4. Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM)

Scanning Thermal Microscopy (SThM) image of the R/W head from a commercial hard drive. SThM data is overlaid as color on the rendered surface topography, with darker regions exhibiting higher thermal conductivity. The difference in temperature between the yellow and orange regions is ~0.02°C. Polishing lines are clearly resolved in the topography. Imaged with the MFP-3D, 8.5µm scan.
MFP-3D AFM
Brochure

Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.


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