Extended Z-Range Head

The MFP-3D Extended Z-Range Head provides 40 µm Z range for imaging tall samples and long-range force measurements, with very minimal degradation of imaging performance (atomic resolution is still achievable).

Accommodates high feature samples with a 40 µm Z scan range
Proprietary nanopositioning sensors are utilized for unprecedented precision and accuracy

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Resources

Datasheet

MFP-3D™ Extended Head for High Feature Samples Data Sheet

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Apr

22

Location:

KAUST Campus, Thuwal (Saudi Arabia)

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Asylum Research, Magnetic Resonance, WITec | Raman

DCC, Daejeon, South Korea

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Asylum Research, NanoScience

San Diego, CA | Town & Country Resort

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NanoAnalysis, Asylum Research, WITec | Raman

New Orleans, Louisiana (USA)

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Asylum Research, Plasma Technology

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