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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Adapting to Experimental Needs
  4. Extended Z-Range Head

Extended Z-Range Head

MFP-3D Extended Z Head
MFP-3D Origin
Datasheet

The MFP-3D Extended Z-Range Head provides 40 µm Z range for imaging tall samples and long-range force measurements, with very minimal degradation of imaging performance (atomic resolution is still achievable).

  • Accommodates high feature samples with a 40 µm Z scan range
  • Proprietary nanopositioning sensors are utilized for unprecedented precision and accuracy


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Digital Access Module and Extended Digital Interface Module
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Sample Mounts
Vacuum Sample Chuck

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May
15
Materials Science Workshop
Location:
High Wycombe, UK
Businesses Attending:
NanoAnalysis, Asylum Research
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