GaFeO3 Thin Film
180 nm GaFeO3 thin film epitaxially grown on ITO buffered yittria stabilized zirconia. PFM amplitude overlaid on topography (left) and PFM phase overlaid on topography (right). 1.25 µm scan.
Sample courtesy of Somdutta Mukherjee, Rajeev Gupta and Ashish Garg, Department of Materials Science and Engineering, Indian Institute of Technology, Kanpur.
Last Updated: June 10, 2020, 1:52 pm
Category: Asylum Gallery Image