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Cypher ES Environmental AFM

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical environments. The Cypher ES is the ultimate AFM for the most demanding experimental requirements.

  • Routinely achieve higher resolution than other AFMs
  • Fast scanning with results in seconds instead of minutes
  • Every step of operation is simpler for remarkable productivity
  • Small footprint in the lab, huge potential to grow in capability
  • Support that goes above and beyond your expectations
  • Enables gas and liquid perfusion through a sealed cell
  • Controls sample temperature over a wide 0–250°C range
  • Broadest compatibility with harsh chemicals


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Cypher Family Brochure

Routinely achieve higher resolution than other AFMs

  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources

Fast scanning with results in seconds instead of minutes

  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes

Support that goes above and beyond your expectations

  • Includes a standard two-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry

Enables gas and liquid perfusion through a sealed cell

  • Fully sealed sample cells maintain a controlled environment and eliminate the risk of leaks
  • Compatible with fast scanning and all environmental control accessories

Controls sample temperature over a wide 0–250°C range

  • Two options are available: Heating to 250°C or Heating and Cooling 0–120°C
  • Low-drift design lets you keep imaging while ramping the temperature
  • Quick and easy to setup and use, no external controllers, tubing, wires, etc.

Broadest compatibility with harsh chemicals

  • Sample cells are constructed so that only fused silica and the probe clip (PEEK or stainless steel) are in contact with liquid
  • Optional glovebox configuration allows use with oxygen or water sensitive materials

Included Operating Modes

Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)

Note: Some optional modes on the Cypher ES require blueDrive photothermal excitation. sMIM requires the Cypher S scanner.

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