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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
Brochure

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


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Scanning Microwave Impedance Microscopy (sMIM)

Upcoming events

Jul
1
MMC 2019
Location:
Manchester, UK
Businesses Attending:
NanoAnalysis, Asylum Research, Andor, Imaris
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Jul
2
Portugal Atomic Force Microscopy Workshop 2019
Location:
FCT-UNL, Caparica, Portugal
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Jul
9
SPC 2019
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Hangzhou, China
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Jul
14
International Symposium on Applications of Ferroelectrics (ISAF) 2019
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Lausanne, Switzerland
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