Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.

MFP-3D AFM

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.

Request Pricing Add to quote list View this product on your quote list

Resources

Options and Accessories for the MFP-3D AFM Family

You may also be interested in...

Upcoming events

Aachen, Germany

Businesses Attending:

Plasma Technology, Asylum Research, WITec | Raman

Cancun, QR, Mexico

Businesses Attending:

NanoAnalysis, Asylum Research, WITec | Raman

Pasadena, CA, USA

Businesses Attending:

NanoAnalysis, Asylum Research, WITec | Raman

Businesses Attending:

Magnetic Resonance, Asylum Research, WITec | Raman

Latest news

HVA150 – High Voltage Accessory for Jupiter XR, Large Sample Atomic…

HVA150 – High Voltage Accessory for Jupiter XR, Large Sample Atomic Force…

Read full article >

Oxford Instruments response on the Conflict in Ukraine

Oxford Instruments remains committed to supporting our customers globally…

Read full article >

Sir Martin Wood, 1927 - 2021

Oxford Instruments was saddened to learn of the death of our founder, Sir…

Read full article >

Oxford Instruments joins Chicago Quantum Exchange (CQE)

Oxford Instruments has announced today that they are partnering with the…

Read full article >