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  2. AFM Systems and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
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STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


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Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)

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