Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
Jupiter AccessoriesPolyHeaterCoolerHeaterImaging in LiquidConductive AFMScanning Capacitance Microscopy (SCM)
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case StudiesWebinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
Brochure

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell for MFP‑3D AFMs
Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)
Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)

Upcoming events

Aug
2
M&M 2020
Location:
Milwaukee, WI, USA
Businesses Attending:
NanoAnalysis, Asylum Research
View Event >
Aug
23
EMC 2020
Location:
Copenhagen, Denmark
Businesses Attending:
NanoAnalysis, Asylum Research
View Event >
Oct
19
Analytica 2020
Location:
Munich, Germany
Businesses Attending:
Magnetic Resonance, NanoAnalysis, Andor, Asylum Research
View Event >
Oct
27
Multifrequency AFM Conference 2020
Location:
Madrid, Spain
Businesses Attending:
Asylum Research
View Event >

Latest news

COVID-19 update

The interests and wellbeing of our employees and customers are at the centre…

Read full article >
Jupiter XR Large-Sample AFM Now Includes New Ergo Software

Oxford Instruments Asylum Research Jupiter XR Large-Sample AFM Now Includes…

Read full article >
New Relate Software

Press Release: New “Relate” Software for Correlative Imaging with Atomic…

Read full article >
Webinar: Atomic Force Microscopy in Nanotribology

Oxford Instruments Asylum Research Announces Upcoming Webinar: “Atomic…

Read full article >

© Oxford Instruments 2020

Website by Miramar Communications Ltd