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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
Brochure

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


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Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)

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WEBINAR: “Probing Nanoscale Structure & Properties of Polymers:…

October 16th: Learn How AFM Can Advance Polymer R&D

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New Ergo Software for Asylum Research AFMs

Oxford Instruments recently announced Ergo, a new software platform for…

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Asylum Research Announces the New Jupiter XR Large-Sample AFM

Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM),…

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