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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
Brochure

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


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Electrochemical Strain Microscopy (ESM)
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Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)

Upcoming events

Mar
4
APS March Meeting 2019
Location:
Boston Convention and Exhibition Center (BCEC) Boston, MA, USA
Businesses Attending:
NanoScience, Asylum Research
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Mar
31
DPG Spring Meeting 2019
Location:
Regensberg, Germany
Businesses Attending:
NanoScience, Asylum Research
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Nanotribology with AFM Application Note

The "Nanotribology with the AFM" application note describes the latest…

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Webinar on AFM Characterization of Photovoltaics Sept.13

Oxford Instruments Asylum Research, in conjunction with the Materials Research…

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