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  3. MFP-3D Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.
MFP-3D AFM
Brochure

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.


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Electrochemical Strain Microscopy (ESM)
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Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)
Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)

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