Piezoresponse Force Microscopy (PFM)

Image shows vertical PFM amplitude overlaid on AFM topography for a lead titanate film, 5µm scan. Imaged with the MFP-3D AFM. Images courtesy of A. Gruverman and D. Wu, UNL. Sample courtesy H. Funakubo.

MFP-3D AFM

The Piezo Force Module enables operation at high tip biases up to ±220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics (up to ±150 V on MFP-3D Infinity). Compatible with all MFP-3D AFMs except Origin.

Crosstalk-free measurements
High sensitivity
Enables tip biases up to ±220 V (up to ±150 V on MFP-3D Infinity)

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Piezoresponse Force Microscopy with Asylum Research AFMs

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