Scanning Microwave Impedance Microscopy (sMIM)
sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).
- Provides higher lateral resolution (<50 nm) and superior signal-to-noise (>10X)
- Operates up to 80X faster and at lower power compared to competing technologies
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