Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Support
Contact Your Local Sales EngineerRequest Product and Pricing Information
Product and Applications Support
Get AFM Support NowAsk for Help on the User Forum
News
Events
eCommerce
Application

Process Mineralogy and Chemical Analysis

  1. AFM Home
  2. Applications
  3. Process Mineralogy and Chemical Analysis

Related to:

A full suite of SEM/EDS based automated process mineralogy tools and other chemical analysis tools

Products

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current…

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

Find out more

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

Find out more

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring…

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

Find out more

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

Scanning Microwave Impedance Microscopy (sMIM)

Find out more

ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA.…

Conductive AFM (ORCA)

Find out more

© Oxford Instruments 2019

Website by Miramar Communications Ltd