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Process Mineralogy and Chemical Analysis

  1. AFM Home
  2. Applications
  3. Process Mineralogy and Chemical Analysis

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A full suite of SEM/EDS based automated process mineralogy tools and other chemical analysis tools

Products

ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA.…

Conductive AFM (ORCA)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring…

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

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sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

Scanning Microwave Impedance Microscopy (sMIM)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current…

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

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