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Process Mineralogy and Chemical Analysis
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A full suite of SEM/EDS based automated process mineralogy tools and other chemical analysis tools

Products

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

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ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA.…

Conductive AFM (ORCA)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring…

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

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NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current…

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

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sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

Scanning Microwave Impedance Microscopy (sMIM)

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