Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
Jupiter AccessoriesVariable Magnetic Field ModuleNanoRack Sample Stretching StageScanning Capacitance Microscopy (SCM)PolyHeaterCoolerHeaterImaging in LiquidConductive AFM
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Probes
Probe Stores
US & CanadaEuropeAsiaLatin America, New Zealand, Hong Kong, UAE, Saudi ArabiaChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
Webinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
Shop
UKEuropeUS & CanadaJapanAsiaChina
Our Asia Online Store is live. Visit for consumables, spares, software and training. Launching soon: Japan
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Electrochemical Strain Microscopy (ESM)

Electrochemical Strain Microscopy (ESM)

Electrochemical Strain Microscopy diagram
Datasheet

ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.

  • Probes electrochemical processes in battery and fuel cell materials
  • Measures the direct coupling of ionic current to strain in nm-scale volumes with unprecedented resolution


Request Pricing Add to quote list

You may also be interested in...

Electrochemistry Cell
High-Voltage Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA) - Cypher
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Electrochemical Strain Microscopy (ESM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS: High Speed Video-Rate AFM

Related Applications

EV TechnologiesBattery Technology

© Oxford Instruments 2021

Website by Miramar Communications Ltd