Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
Sustainability Investors Careers News Events
Investors Careers
  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Microwave Impedance Microscopy (sMIM)

Scanning Microwave Impedance Microscopy (sMIM)

sMIM image of a semiconductor device showing possible failure points
Datasheet

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

  • Provides higher lateral resolution (10×)

  • Operates up to 80× faster and at lower power compared to competing technologies


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell
High-Voltage Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA) - Cypher
Scanning Tunneling Microscopy (STM)
Scanning Microwave Impedance Microscopy (sMIM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS: High Speed Video-Rate AFM

Related Applications

Failure Analysis

© Oxford Instruments 2023

Website by Miramar Communications Ltd