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  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Microwave Impedance Microscopy (sMIM)

Scanning Microwave Impedance Microscopy (sMIM)

sMIM image of a semiconductor device showing possible failure points
Datasheet

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

  • Provides higher lateral resolution (10×)

  • Operates up to 80× faster and at lower power compared to competing technologies


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Failure Analysis

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