Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Support
Contact Your Local Sales EngineerRequest Product and Pricing Information
Product and Applications Support
Get AFM Support NowAsk for Help on the User ForumSupport and Warranty Policies
News
Events
eCommerce
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Microwave Impedance Microscopy (sMIM)

Scanning Microwave Impedance Microscopy (sMIM)

sMIM image of a semiconductor device showing possible failure points
Datasheet

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

  • Provides higher lateral resolution (10×)

  • Operates up to 80× faster and at lower power compared to competing technologies


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell
High-Voltage Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA)
Scanning Tunneling Microscopy (STM)
Scanning Microwave Impedance Microscopy (sMIM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

Related Applications

Failure Analysis

© Oxford Instruments 2019

Website by Miramar Communications Ltd