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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples


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Scanning Tunneling Microscopy (STM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

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Jul
1
MMC 2019
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Manchester, UK
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Portugal Atomic Force Microscopy Workshop 2019
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9
SPC 2019
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Hangzhou, China
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Jul
14
International Symposium on Applications of Ferroelectrics (ISAF) 2019
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Lausanne, Switzerland
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