Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
Sustainability Investors Careers News Events
Investors Careers
  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell
High-Voltage Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA) - Cypher
Scanning Microwave Impedance Microscopy (sMIM) for cypher
Scanning Tunneling Microscopy (STM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS: High Speed Video-Rate AFM

Upcoming events

May
25
Microscopy Society of Canada 2026
Location:
Montreal I Quebec I Canada
Businesses Attending:
Asylum Research, NanoAnalysis, Raman
View Event >
May
27
Mastering AFM Imaging - In-personTraining, Concord, MA
Location:
Concord, MA
Businesses Attending:
Asylum Research
View Event >
Aug
2
M&M 2026
Location:
Baird Center | Milwaukee, Wisconsin
Businesses Attending:
Asylum Research, NanoAnalysis, NanoIndentation, Raman
View Event >
Aug
19
nanoFabUK Symposium 2026
Location:
London, UK
Businesses Attending:
Asylum Research, Magnetic Resonance, Plasma Technology, Raman
View Event >

Latest news

Introducing the Jupiter Discovery AFM

Large-Sample AFM Provides Next-Generation Performance for Everyone

Read full article >
Oxford Instruments Asylum Research Releases New Vero VRS1250 Atomic…

Oxford Instruments Asylum Research announced today the release of the new…

Read full article >
Oxford Instruments Asylum Research Receives R&D 100 and Frost & Sullivan…

The Vero AFM is now an award winner! Vero's recent accolades include: 2024…

Read full article >
Powerful AFM Offline Analysis Software Now Available for Oxford Instruments…

AR Maps is a new and powerful software analysis package for the Jupiter…

Read full article >

© Oxford Instruments 2026

Website by Miramar Communications Ltd