Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM Software
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
eCommerce
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell
High-Voltage Piezoresponse Force Microscopy (PFM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

Upcoming events

Oct
22
AFM Talk at Yale University Tuesday Technology Talks
Location:
Americas
Businesses Attending:
Asylum Research
View Event >
Oct
24
University of Arizona AFM Lunch and Learn
Location:
Americas
Businesses Attending:
Asylum Research
View Event >
Nov
6
Metrology Symposium at Stanford University
Location:
Americas
Businesses Attending:
Asylum Research, NanoAnalysis, Plasma Technology
View Event >
Nov
12
Semicon Europa 2019
Location:
Munich, Germany
Businesses Attending:
Plasma Technology, Asylum Research, NanoAnalysis
View Event >

Latest news

WEBINAR: “Probing Nanoscale Structure & Properties of Polymers:…

October 16th: Learn How AFM Can Advance Polymer R&D

Read full article >
New Ergo Software for Asylum Research AFMs

Oxford Instruments recently announced Ergo, a new software platform for…

Read full article >
Asylum Research Announces the New Jupiter XR Large-Sample AFM

Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM),…

Read full article >
Soft, Squishy and Sticky: AFM for Mechanobiology Webinar on Oct.…

The AFM for Mechanobiology Webinar is an insightful overview of atomic…

Read full article >

© Oxford Instruments 2019

Website by Miramar Communications Ltd