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  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples


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