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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. Scanning Tunneling Microscopy (STM)

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples


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Scanning Tunneling Microscopy (STM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

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WEBINAR: “Probing Nanoscale Structure & Properties of Polymers:…

October 16th: Learn How AFM Can Advance Polymer R&D

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Oxford Instruments recently announced Ergo, a new software platform for…

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Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM),…

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