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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. High-Voltage Piezoresponse Force Microscopy (PFM)

High-Voltage Piezoresponse Force Microscopy (PFM)

PFM image of PVDF polymer. The piezoelectric response of PVDF is widely exploited in tactile sensors. PFM lateral amplitude is shown on 3D topography, 2 ?m scan. Sample courtesy D. Guo, Institute of Acoustics, Chinese Academy of Science.
Datasheet

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.

  • Crosstalk-free measurements
  • High sensitivity and speed
  • Uses exclusive Dual AC Resonance Tracking (DART)

  • Enables tip biases up to ±150 V


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Cypher ES Environmental AFM
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Mar
4
APS March Meeting 2019
Location:
Boston Convention and Exhibition Center (BCEC) Boston, MA, USA
Businesses Attending:
NanoScience, Asylum Research
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Mar
31
DPG Spring Meeting 2019
Location:
Regensberg, Germany
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