Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Support
Contact Your Local Sales EngineerRequest Product and Pricing Information
Product and Applications Support
Get AFM Support NowAsk for Help on the User ForumSupport and Warranty Policies
News
Events
eCommerce
  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanoelectrical Properties
  4. High-Voltage Piezoresponse Force Microscopy (PFM)

High-Voltage Piezoresponse Force Microscopy (PFM)

PFM image of PVDF polymer. The piezoelectric response of PVDF is widely exploited in tactile sensors. PFM lateral amplitude is shown on 3D topography, 2 ?m scan. Sample courtesy D. Guo, Institute of Acoustics, Chinese Academy of Science.
Datasheet

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.

  • Crosstalk-free measurements
  • High sensitivity and speed
  • Uses exclusive Dual AC Resonance Tracking (DART)

  • Enables tip biases up to ±150 V


Request Pricing Add to quote list

You may also be interested in...

Electrochemical Strain Microscopy (ESM)
Electrochemistry Cell
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Conductive AFM (ORCA)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Piezoresponse Force Microscopy (PFM)
Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS Video-Rate AFM

Upcoming events

Mar
4
APS March Meeting 2019
Location:
Boston Convention and Exhibition Center (BCEC) Boston, MA, USA
Businesses Attending:
NanoScience, Asylum Research
View Event >
Mar
31
DPG Spring Meeting 2019
Location:
Regensberg, Germany
Businesses Attending:
NanoScience, Asylum Research
View Event >

Latest news

Soft, Squishy and Sticky: AFM for Mechanobiology Webinar on Oct.…

The AFM for Mechanobiology Webinar is an insightful overview of atomic…

Read full article >
British Embassy Open Day 2018

British Embassy Open Day 2018

Read full article >
Nanotribology with AFM Application Note

The "Nanotribology with the AFM" application note describes the latest…

Read full article >
Webinar on AFM Characterization of Photovoltaics Sept.13

Oxford Instruments Asylum Research, in conjunction with the Materials Research…

Read full article >

© Oxford Instruments 2019

Website by Miramar Communications Ltd