Part of the Oxford Instruments Group

High-Voltage Piezoresponse Force Microscopy (PFM)

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.

  • Crosstalk-free measurements
  • High sensitivity and speed
  • Uses exclusive Dual AC Resonance Tracking (DART)
  • Enables tip biases up to ±150 V

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