Jupiter XR AFM

Jupiter XR showing a 200 mm wafer being placed on the sample chuck

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

Higher resolution than any other large-sample AFM
Extended range 100 μm scanner is 5-20× faster than most other AFMs
From setup to results, every step is simpler and faster
Modular design adapts to your needs for maximum flexibility

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Highest Performance

Higher resolution than any other large-sample AFM
Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

Fully-motorized laser and detector setup eliminates manual adjustment of knobs
Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
Sharp top-view optics help you easily locate your precise region of interest
Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

Support for a full range of imaging modes
Modular design makes it fast and simple to add accessories and future upgrades
Flexible software makes routine measurements easy while enabling advanced research
AR Maps - comprehensive analysis software for all types of AFM data

Support that goes above and beyond your expectations

Includes a standard one-year comprehensive warranty
No-charge technical support and basic applications support for life
Affordable support agreements that offer extended warranties and advanced training

Included Operating Modes

Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Included because Jupiter XR comes with blueDrive

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode

Optional Operating Modes

Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

High Voltage nanoTDDB

Nanoscale Time Dependent Dielectric Breakdown experiements up to ±150 V.

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Conductive AFM

Conductive AFM imaging with the new ORCA cantilever holder.

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Scanning Capacitance Microscopy (SCM)

Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.

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High Voltage Accessory

High voltage operation up to ±150 V.

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Imaging in Liquid

Droplet imaging with the new liquid cantilever holder.

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CoolerHeater

Sub-zero temperature control with the CoolerHeater accessory.

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Fast Force Mapping

Force curve-based nanomechanical mapping mode.

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Variable Magnetic Field Module

Variation of magnetic field: in-plane and out-of-plane of the sample.

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PolyHeater

Sample heating up to 300°C with the PolyHeater accessory.

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AM-FM Viscoelastic Mapping Mode

Tapping mod-based nanomechanical mapping mode.

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NanoRack

Sample stage for experiments under tension or compression.

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Support and Service Agreements

More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users.