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Jupiter Discovery AFM for Core Facilities

The Ideal AFM for Microscopy Core Facilities

Transform Your Lab

Shared instrumentation facilities face unique challenges. Their user base is diverse in both research topics and AFM experience levels. Facility managers must train and support many users and instruments. Limited budgets must be balanced between new equipment purchases and maintaining existing tools. Typical AFMs often worsen these challenges by requiring extensive training, offering limited versatility, and being prone to damage from inexperienced users.

The Jupiter Discovery AFM is different—designed specifically to be much easier to use for new users while offering all the research versatility and ultra-high performance required by more experienced researchers.

Consistent with their mission to train future scientists and engineers, university microscopy core facilities host students who are not only new to AFM but often lack experience with advanced instrumentation. Traditional AFMs pose a steep learning curve, requiring multiple training sessions to achieve basic competence. The Jupiter Discovery flattens this curve with features such as:

Pre-mounted probes make probe exchange quick and easy

FFM-Topography with AutoPilot readily images the 0.75-nm steps on this silicon carbide substrate (2 µm scan size).

  • Pre-mounted probes: Users handle pre-mounted probes with their fingers instead of tweezers, eliminating a common frustration.
  • Guided workflow: A simple interface walks users through setup. Once the probe and sample are placed, all steps are controlled via software, reducing complexity and risk of damage.
  • Side-view camera: This unique feature makes it easy to gauge the distance between the probe and sample, enabling users to confidently engage the AFM and start imaging.
  • FFM-Topography with AutoPilot: This exclusive imaging mode makes imaging as simple as selecting a scan area and clicking Start, with algorithms automatically optimizing scan parameters.

Application Scientist Jason Li shows how easy it is to quickly get high quality images using Jupiter Discovery.

Application Sophia Hohlbauch shows how FFM-Topography with AutoPilot automatically optimizes imaging parameters.

University microscopy core facilities bring together researchers from a wide variety of research fields including 2D materials, semiconductors, polymers, and life sciences. Some users only require basic AFM topography measurements while others need more advanced characterization techniques. Jupiter Discovery covers it all, including:

  • Ultra-high performance: Jupiter makes it easy to achieve ultra-high resolution for users who want to push the limits, with a noise floor significantly lower than other large-sample AFMs.
  • Wide range of modes: Jupiter includes a full suite of modes for nanomechanical, nanoelectrical, and functional measurements.
  • Easy to use accessories: A full range of accessories help users achieve their most ambitious research goals.
  • Large sample stage: Jupiter’s 200-mm sample stage accommodates both wafers and small samples.

Core facilities often operate on tight budgets, making it critical to carefully consider the acquisition, operating, and maintenance costs of instruments along with their utilization and usage fees.

  • Affordable high performance AFM: Jupiter Discovery is priced competitively with other research AFMs. Its scalable configuration enables options and accessories to be added when budgets allow.
  • Robust, low-maintenance design: Unlike old AFM models based on piezo tube scanners, the Jupiter Discovery design is not easily damaged, which makes maintenance costs very low and predictable.
  • Low operating costs: AFM probes are the main consumable and even the new pre-mounted probes cost just a few dollars more than comparable value-priced AFM probes.
Scanner design

Scanner design is highly robust and unlikely to be damaged by mishandling, even by less experienced operators.

Pre-mounted probes

Pre-mounted probes are competitively priced and eliminate the waste that occurs when ordinary probes are accidentally dropped.

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