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  1. AFM Home
  2. Asylum Research Atomic Force Microscopy Systems (AFMs) and Accessories
  3. Cypher Accessories: Nanomechanical and Thermal Properties
  4. Interferometric Displacement Sensor

Interferometric Displacement Sensor

Icon representing scanning thermal microscopy (SThM)
Datasheet

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling, enabling measurements that are more reproducible and accurate for nanomechanics.


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Nanomaterial Growth and CharacterisationMechanical and Electrical PropertiesMeasurement of Polymer and Polymer Phase Properties

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