Interferometric Displacement Sensor

Icon representing scanning thermal microscopy (SThM)

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling, enabling measurements that are more reproducible and accurate for nanomechanics.

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Interferometric Displacement Sensor for the Cypher AFM

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Nanomaterial Growth and Characterisation Mechanical and Electrical Properties Measurement of Polymer and Polymer Phase Properties

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