Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
Jupiter AccessoriesPolyHeaterCoolerHeaterImaging in LiquidConductive AFMScanning Capacitance Microscopy (SCM)
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Probes
Probe Stores
US & CanadaEuropeAsiaLatin America, New Zealand, Hong Kong, UAE, Saudi ArabiaChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
Webinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
Shop
UKEuropeUS & CanadaJapanAsiaChina
Our Asia Online Store is live. Visit for consumables, spares, software and training. Launching soon: Japan
News
Events
eCommerce
  1. AFM Home
  2. AFM Systems and Accessories
  3. Cypher Accessories: Nanomechanical and Thermal Properties
  4. Interferometric Displacement Sensor

Interferometric Displacement Sensor

Icon representing scanning thermal microscopy (SThM)
Datasheet

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling, enabling measurements that are more reproducible and accurate for nanomechanics.


Request Pricing Add to quote list

You may also be interested in...

Cypher ES Environmental AFM
Cypher ES Polymer Edition AFM
Cypher S AFM Microscope
Cypher VRS: High Speed Video-Rate AFM
AM-FM Viscoelastic Mapping Mode

Related Applications

Nanomaterial Growth and CharacterisationMechanical and Electrical PropertiesMeasurement of Polymer and Polymer Phase Properties

Latest news

Soft, Squishy and Sticky: AFM for Mechanobiology Webinar on Oct.…

The AFM for Mechanobiology Webinar is an insightful overview of atomic…

Read full article >
Nanotribology with AFM Application Note

The "Nanotribology with the AFM" application note describes the latest…

Read full article >

© Oxford Instruments 2021

Website by Miramar Communications Ltd