Part of the Oxford Instruments Group

Interferometric Displacement Sensor

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is utilized in conventional optical beam detection (OBD). IDS eliminates the artifacts due to electrostatic coupling, enabling measurements that are more reproducible and accurate for nanomechanics.

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Nanomaterial Growth and CharacterisationMechanical and Electrical PropertiesMeasurement of Polymer and Polymer Phase Properties

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