Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM Software
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
WebinarsGalleryIntroduction to Atomic Force Microscopy
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
eCommerce
Application

Nanomaterial Growth and Characterisation

  1. AFM Home
  2. Applications
  3. Nanomaterial Growth and Characterisation

Related to: Advanced Manufacturing

"Nanomaterial Growth and Characterisation" encompasses a broad range of materials, research fields, and applications for which Atomic Force Microscopy (AFM) is widely used for characterisation. Please refer to the pages below for in-depth reviews of how AFM is used in each of these applications.

Common AFM applications in this category include:

AFM for Polymer Science

Find out more

AFM for Semiconductor and Microelectronics Research

Find out more

AFM for Thin Films and Coatings

Find out more

AFM for Magnetics and Data Storage Research

Find out more

AFM Tools for Piezoelectrics and Ferroelectrics Research

Find out more

AFM for Nanomechanical Measurements

Find out more

AFM for Graphene and 2D Materials

Find out more

AFM for Nanoelectrical Measurements

Find out more

Products

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides…

Jupiter XR AFM

Find out more

The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises…

MFP-3D-BIO AFM

Find out more

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the…

Cypher S AFM Microscope

Find out more

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

Find out more

The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile…

MFP-3D Origin+ AFM

Find out more

The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance…

MFP-3D Origin AFM

Find out more

The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility…

Cypher ES Polymer Edition AFM

Find out more

The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor

Find out more

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed…

Cypher ES Environmental AFM

Find out more

The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with…

MFP-3D Infinity AFM

Find out more

The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution,…

Cypher VRS Video-Rate AFM

Find out more

Learning Centre Assets

AFM vs. STM for Molecular Resolution Imaging

Latest news:

Soft, Squishy and Sticky: AFM for Mechanobiology Webinar on Oct.…

The AFM for Mechanobiology Webinar is an insightful overview of atomic…

Read full article >
Nanotribology with AFM Application Note

The "Nanotribology with the AFM" application note describes the latest…

Read full article >

© Oxford Instruments 2020

Website by Miramar Communications Ltd