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Application

Nanomaterial Growth and Characterisation

  1. AFM Home
  2. Applications
  3. Nanomaterial Growth and Characterisation

Related to: Advanced Manufacturing

"Nanomaterial Growth and Characterisation" encompasses a broad range of materials, research fields, and applications for which Atomic Force Microscopy (AFM) is widely used for characterisation. Please refer to the pages below for in-depth reviews of how AFM is used in each of these applications.

Common AFM applications in this category include:

AFM for Polymer Science

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AFM for Semiconductor and Microelectronics Research

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AFM for Thin Films and Coatings

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AFM for Magnetics and Data Storage Research

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AFM Tools for Piezoelectrics and Ferroelectrics Research

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AFM for Nanomechanical Measurements

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AFM for Graphene and 2D Materials

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AFM for Nanoelectrical Measurements

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Products

The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance…

MFP-3D Origin AFM

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The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the…

Cypher S AFM Microscope

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The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises…

MFP-3D-BIO AFM

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor (IDS)

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The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile…

MFP-3D Origin+ AFM

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The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides…

Jupiter XR AFM

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The Interferometric Displacement Sensor (IDS) option for the Cypher AFM directly measures cantilever deflection instead of cantilever angle that is…

Interferometric Displacement Sensor

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The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution,…

Cypher VRS Video-Rate AFM

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The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed…

Cypher ES Environmental AFM

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The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with…

MFP-3D Infinity AFM

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The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility…

Cypher ES Polymer Edition AFM

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Learning Centre Assets

AFM vs. STM for Molecular Resolution Imaging

Latest news:

Soft, Squishy and Sticky: AFM for Mechanobiology Webinar on Oct.…

The AFM for Mechanobiology Webinar is an insightful overview of atomic…

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Nanotribology with AFM Application Note

The "Nanotribology with the AFM" application note describes the latest…

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Bringing The Nanoworld Together 2019

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