Part of the Oxford Instruments Group
Expand
Application
Nanomaterial Growth and Characterisation

Related to: Advanced Manufacturing

"Nanomaterial Growth and Characterisation" encompasses a broad range of materials, research fields, and applications for which Atomic Force Microscopy (AFM) is widely used for characterisation. Please refer to the pages below for in-depth reviews of how AFM is used in each of these applications.

Common AFM applications in this category include:

Products