Characterization of Two-Dimensional Materials with Atomic Force Microscopy

Watch Webinar Now On Demand

This webcast will begin with a brief introduction to the many capabilities that AFM provides for 2D materials research, illustrated by examples from recent research to provide a broad overview of how AFM is helping to advance our understanding of these materials.

Dr. Zhihai Cheng, Professor of Physics at Renmin University of China, will then present results from several of his group’s research projects on the interfacial structures and properties of 2D Materials, including a study of strain-induced anisotropic shear behaviour, visualization and effects of water-intercalation at the homo-/hetero-interfaces, and interfacial strain-induced patterned mechanical and electronical structures at a MoS₂/SiO₂ and WS₂/SiO₂ interface.

You will learn how AFM can:

• Resolve the structure of 2D materials to evaluate their preparation and modification
• Measure and map the unique electrical and mechanical properties of 2D materials
• Evaluate the performance of 2D materials incorporated within proposed devices