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Fabrication and Characterisation of Light Emitting Devices
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Related to: Photonics

Atomic Force Microscopy (AFM) can probe the nanoscale topography and electrical and functional properties of thin films and thin film devices like LEDs. Please refer to the pages linked below for more information about AFM use in this area.

AFM for Semiconductor and Microelectronics Research

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AFM for Thin Films and Coatings

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Products

The Asylum Research Cypher S is the base model of the Cypher AFM family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family…

Cypher S AFM

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The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed…

Cypher ES Environmental AFM

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The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile…

MFP-3D Origin+ AFM

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The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility…

Cypher ES Polymer Edition AFM

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The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises…

MFP-3D-BIO AFM

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The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with…

MFP-3D Infinity AFM

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The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance…

MFP-3D Origin AFM

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The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution,…

Cypher VRS Video-Rate AFM

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