Related to: Polymers
Atomic Force Microscopy (AFM) is a powerful tool for studying the nanoscale morphology and mechanical, electrical, and functional properties of polymers. Please refer to the pages linked below for in-depth reviews of AFM applications in this area.
The Cypher ES Heating Stage allows heating of samples in gas environments from ambient to 250°C in a sealed environment.
AM-FM mode on Jupiter AFMs combines the features and benefits of standard tapping mode with nanomechanical property mapping. Standard tapping mode provides non-invasive, high-resolution…
Force-distance curve mapping technique that operates at up to 300 Hz z-rate and captures every force curve in the image with real-time and offline models for additional data analysis…
The PolyHeater is a modular heating stage designed for high temperature polymer studies from ambient to 300°C in air or a controlled gas environment. It supports samples up to 20 mm…
Contact Resonance Viscoelastic Mapping Mode for Cypher AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 100’s GPa modulus…
AM-FM mode on MFP-3D AFMs combines the features and benefits of standard tapping mode with nanomechanical property mapping. Standard tapping mode provides non-invasive, high-resolution…
Fast Force Mapping on Jupiter XR AFM measures force-distance curves at high speed (up to 2500 Hz) while capturing every curve in the image. Both real-time and offline analysis models…
Fast Force Mapping on Cypher AFMs measures force-distance curves at high speed (up to 1000 Hz) while capturing every curve in the image. Both real-time and offline analysis models can…
Contact Resonance Viscoelastic Mapping Mode for MFP-3D AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 300 GPa modulus…
AM-FM mode on Cypher AFMs combines the features and benefits of standard tapping mode with nanomechanical property mapping. Standard tapping mode provides non-invasive, high-resolution…
Press Release: New “Relate” Software for Correlative Imaging with Atomic…