Part of the Oxford Instruments Group

AFM Workshop at
University of Illinois Urbana-Champaign
June 6, 2019

Demo Jupiter XR AFM—
A new large-sample AFM imaging for improved resolution, speed and operation 

The University of Illinois Materials Research Lab will be hosting the 2019 Advanced Materials Characterization Workshop on June 3-5. Asylum Research is a sponsor and part of the program presenting on June 4, as well as offering demonstrations of the new Jupiter XR Atomic Force Microscope during breaks and all day on June 6.

The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

Who should attend?

Both experienced AFM users as well as less experienced researchers are welcome. Join us and learn more about how AFM could impact your projects.


Registration for the AFM demonstration on June 6 is free, but all attendees must register due to limited seating. 

If you would like to bring your samples, please indicate your interest when registering and you will be contacted to discuss your sample and schedule a time. 


Materials Research Laboratory
University of Illinois at Urbana-Champaign

104 South Goodwin Ave. MC 230
Urbana, IL 61801
Room MRL 0014

To register for the 2019 AMC Workshop click here

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Images left to right:  Epitaxial silicon, insulated gate of a bipolar transistor, polymer blend, sol-gel piezoelectric thin film.