Part of the Oxford Instruments Group

AFM Workshop
UPenn - Singh Center for Nanotechnology
June 11-12, 2019

Discover new horizons in large-sample AFM imaging for improved resolution, speed and operation 

Advances in AFM technology have greatly improved the overall performance of large-sample atomic force microscopes (AFMs).  Asylum Research invites you to learn how the new Jupiter XR AFM can increase accuracy and resolution in your AFM measurements and make imaging faster and easier for many material samples such as thin films, coatings, devices, polymers and more.  Industry experts will discuss Jupiter's technology for successful, quantitative results and its easy operation.  You'll also get to see a live demonstration and have a chance to pick the brain of our AFM experts. This is an excellent opportunity for both experienced AFM users as well as less experienced researchers to learn more about how AFM could  impact their projects.


Registration is free, but all attendees must register due to limited seating. 

If you wish to bring a sample to the Open Lab, please indicate your interest when registering and you will be contacted to discuss your sample and schedule a time. Limited spots are available.


Singh Center for Nanotechnology
Glandt Fourm

3205 Walnut St.,
Philadelphia, PA 19104 

Demonstration Labs
Singh Center for Nanotechnology
Room 017

Campus Map

Register Now

Images left to right:  Epitaxial silicon, insulated gate of a bipolar transistor, polymer blend, sol-gel piezoelectric thin film.






June 11

  9:30 – 9:45am

Welcome and Registration

Chris Orsulak, Asylum Research


  9:45 – 10:30

Increased Resolution, Speed and Productivity with the New Asylum Research Jupiter XR Large-Sample AFM

Chris Orsulak, Asylum Research


  10:30 – 11:15

ScanWave Scanning Microwave Impedance Microscopy

Dr. Ravi Chintala, PrimeNano, Inc.






  1:00 – 5:00

Demos and Open Labs


June 12

  9:00 – 12:00pm
  1:00 – 4:00pm

Demos and Open Labs




Chris Orsulak, Asylum Research