AFM Images: Semiconductors and Microelectronics

AlGaAs

sMIM DC capacitance of semiconductor device

sMIM reveals gate failure in SRAM sample

Stressed Silicon Nitride Membrane with Nickel Nanoparticles

Laser Ablation Crater in Sapphire

sMIM makes higher signal-to-noise measurements

Current measurement of SRAM chip

Stressed Silicon Nitride Membrane with Nickel Nanoparticles

Phthalocyanine Film on HOPG

Rubrene

sMIM data channels