A 1 µm scan of anodic oxidation lithography on silicon, written in AC mode. This pattern was first imported as a jpeg and then written with a -10 V bias on a conductive cantilever tip at 20 nm/s. Imaged with the MFP-3D AFM.
Date: 16th November 17
Last Updated: July 12, 2018, 11:13 am
Author: Asylum Research
Category: Asylum Gallery Image
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