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Contaminants on Si

Fundamental resonance mode phase overlaid on topography (left) and second resonance mode amplitude overlaid on the topography (right), 20 µm scan. Imaged with the MFP-3D AFM.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image

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