Part of the Oxford Instruments Group

Contaminants on Si

Fundamental resonance mode phase overlaid on topography (left) and second resonance mode amplitude overlaid on the topography (right), 20 µm scan. Imaged with the MFP-3D AFM.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image