Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEventsContact
Investors Careers
AFM Systems
VERO FAMILY AFMVero SVero ESVero VRS1250
Jupiter Family AFMJupiter Discovery AFM
Cypher Family AFMsCypher L AFMCypher S AFMCypher ES Battery Edition AFMCypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS1250 Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin AFMMFP-3D Origin+ AFMMFP-3D-BIO AFM
AFM Accessories
Jupiter AccessoriesErgo Advanced AutomationErgo KPFMHigh Voltage OptionsAM-FM Viscoelastic Mapping ModeFast Force Mapping (FFM)Variable Magnetic Field ModuleNanoRack Sample Stretching StageScanning Capacitance Microscopy (SCM)PolyHeaterCoolerHeaterImaging in LiquidConductive AFM
Cypher AccessoriesblueDrive Photothermal ExcitationInterferometric Displacement Sensor (IDS)Measuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareAR MapsErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Application
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
AFM Image Gallery
Learning
Materials
Application NotesCase StudiesVirtual PFM AcademyWebinars
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
AFM Probes
Probe Stores
US & CanadaUKEuropeAsiaJapanChina
News
Events
Contact
eCommerce
  1. Learning Centre
  2. Asset

Contaminants on Si

Fundamental resonance mode phase overlaid on topography (left) and second resonance mode amplitude overlaid on the topography (right), 20 µm scan. Imaged with the MFP-3D AFM.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image

Share

© Oxford Instruments 2025

Website by Miramar Communications Ltd