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A grain boundary in epitaxially grown CuInSe2. The neighboring grains are of two different crystallographic orientations and show significant morphological differences. Imaged with the MFP-3D AFM. Image courtesy of A. J. Hall, UIUC, Second place winner, AVS Art-Zone competition.
Date: 16th November 17
Last Updated: February 20, 2019, 5:23 pm
Author: Asylum Research
Category: Asylum Gallery Image