Nanocrystalline conductive diamond film electrically modified in the center by tip contact with an applied voltage and subsequently imaged in EFM mode. Topography derived from the height signal (230nm scale), color from the electric force signal (phase, 1.5 degree scale), 4µm scan. Imaged with the MFP-3D AFM.
Sample courtesy of N. Memmel, Physical Chemistry, University of Innsbruck.
Sample produced by Rho-Best Coating, Steinach, Austria.